THZ

THZ
THZM6055330*RSD

NEW - In Progress
MKP
box with multiple radial terminals
high reliability
AC Power
harsh environment
not suitable for outdoor usage without protection



  • Capacitance tolerance code. See "Description"
  • terminal lenght. Please refer to type specification and terminal drawings
  • lug terminals style. Please refer to type specification and terminal drawings
Dimensions
No data found
Main applications
AC power applications, input-output AC filtering, harsh environment applications
Dielectric
Polypropylene
Electrodes
Vacuum deposited metal layers
Coating
Solvent resistant plastic case with resin sealing (UL 94 V-0). Flame retardant execution
Construction
Extended metallized film: internal series connection for Ur>300Vac (refer to General Technical Information)
Terminals
Degree of protection
IP00
Installation
Whatever position assuring correct heat dissipation. Arrangement of many components with box walls in contact not admitted; suggested minimum distance between side by side elements ≥ 1/8 of the box thickness (B size)
Reference standard
IEC 61071, IEC 60068, RoHS compliant, (AEC Q-200, for biased damp heat tests only and IEC 60384-17:2019, for humidity robustness grades test only)
Climatic category
40/85/56 (IEC 60068/1), GPD (DIN40040)
Please refer also to paragraph C10 (humid ambient) of the General Technical Information
Operating temperature range (case)
-40°...+85°C (+100°C observing voltage and current de-rating)
Max. permissible ambient temperature
+70°C operation at rated power, current, voltage and natural cooling (+85°C observing voltage and current de-rating)
Nominal Capacitance (Cn) µF
Capacitance tolerance (at 1kHz)
±10% (code=K), ±5% (code=J). Other tolerances upon request
Capacitance temperature coefficient
Refer to General Technical Information
Long term stability (at 1kHz)
Capacitance variation ≤ ±1% after a period of 2 years at standard environmental conditions
Rated DC voltage (Ur, up to +85°C)
Rated AC voltage (Urms, up to +85°C)
Temperature de-rated voltage
For operating temperature (case)>+85°C, Ur must be decreased 1,5% for every °C exceeding +85°C, Urms must be decreased 2,5% for every °C exceeding +85°C
Non recurrent surge voltage (Upk)
Self inductance
≤ 1nH/mm of fixing pitch
Maximum pulse rise time V/µs
Maximum peak current (Ipeak)
RMS current (Irms)
Dissipation factor (DF), max.
Typical Equivalent Series Resistance (ESR) at the reference frequency
Insulation resistance (RINS)
≥ 30000s but need not exceed 30 GΩ, between terminals, at ±25°C, after 1 minute of electrification at 100 Vdc
Test voltage between terminals (Ut)
1,6xUr (DC) applied for 60s / 1.6xUrms (AC) applied for 60s, at 25±5°C
Test voltage between terminals and case (Utc)
3kV 50÷60Hz applied for 60s at 25 ±5°C
Damp heat test (steady state)
List of admitted high humidity and temperature tests (please refer to paragraph C10 of the GTI);
Biased tests applicable from 03/2019 production codes only
Test ID Reference Permissible
a Damp heat test (steady state) not biased - IEC60068 YES
b Damp heat test (steady state) biased - AEC Q-200 cockpit YES
c Robustness under high humidity, Grade II - IEC 60384-17:2019 YES
d High robustness under high humidity, Grade III - IEC 60384-17:2019 YES
e Damp heat test (steady state) biased - 70/70/1000 YES
f Humidity load test, Test Cy, Severity II - IEC 60068-2-67 YES
g Humidity load test, Test Cy, Severity III - IEC 60068-2-67 and 85/85/1000 Level 1 - AEC Q-200 YES
Rated Ur (DC) or Urms (AC) applied for test "b", "c", "d", "e" and "f"
Rated Ur (DC) or DE-RATED Urms** (AC) applied for test "g"
**De-rated Urms: 195, 240, 280, 330, 360, 400, 450 Vac
Performance:
Capacitance change ≤ ±2% (for test "a")
Capacitance change ≤ ±10% (for test "b", "c", "d", "e", "f" and "g")
RINS ≥ 50% of initial limit value
Box distorsion ≤ 1/20 of the nominal box thickness (B size) or ≤ 1,5mm whichever is the highest
Tests DF change at 1kHz of units without internal series connection (Ur≤300Vac) DF change at 1kHz of units with internal series connection (Ur>300Vac)
"a" ≤ 0.0010 ≤ 0.0010
"b", "c", "d", "e" ≤2 x initial limit ≤2 x initial limit
"f","g" ≤0,005 for Cn≤8μF; ≤0,008 for Cn>8μF ≤2 x initial limit or ≤0,003 whichever is the highest
Typical capacitance change versus operating time
-3% after 30000 hours at Urms or after 100000 hours at Ur
Life expectancy
≥ 120000 hours (Ur); 40000 hours (Urms); RH < 30%
Failure quota
300/109 component hours
Resistance to soldering heat test
Test conditions:
Solder bath temperature= +260 ±5°C
Dipping time (with heat screen)= 10 ±1s
Performance:
Capacitance change ≤ ±1%
DF change ≤ 0.0010 at 1kHz
RINS ≥ 50% of initial limit value
Warning
This page do not represent the official specification. For reference aims, please refer to the full series specification
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